Detection of Simulated Defect Using IR Temperature Sensors and One Point Heating

Author: Kim Byoung Chul   Heo Young Gun   Suh Yong Kweon   Kim Young Han  

Publisher: MDPI

E-ISSN: 1424-8220|8|5|3345-3354

ISSN: 1424-8220

Source: Sensors, Vol.8, Iss.5, 2008-05, pp. : 3345-3354

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Abstract