A Novel Approach for Automated Analysis of Cell Attachment and Spreading Based on Backscattered Electron Imaging by Scanning Electron Microscopy

Author： Katsen-Globa Alisa   Peter Leonora   Zöllner Susan   Dörge Thomas   Daffertshofer Martin   Preckel Hartwig   Schmitt Daniel   Zimmermann Heiko  

Publisher： MDPI

E-ISSN： 1996-1944|2|3|1402-1416

ISSN： 1996-1944

Source： Materials, Vol.2, Iss.3, 2009-09, pp. : 1402-1416

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Imaging and Microanalysis in Environmental Scanning Electron Microscopy

By Thiel Bradley L.  

Microchimica Acta, Vol. 155, Iss. 1-2, 2006-09 ,pp. : 39-44

Springer Publishing Company

Access to resources Recommend Favorite

Nanocrystalline Domain Identification in Gold Films, by Backscattered Electron Imaging and Energy-Filtered Transmission Electron Microscopy

By Leite C.A.P.   Galembeck F.  

Journal of Colloid and Interface Science, Vol. 235, Iss. 1, 2001-03 ,pp. : 4-8

Academic Press

Access to resources Recommend Favorite

New Instrumental Techniques and Their Application to Electron Microprobe Analysis and Scanning Electron Microscopy

By Smith James P.   Reid Lee R.  

Applied Spectroscopy, Vol. 24, Iss. 4, 1970-07 ,pp. : 420-426

Society for Applied Spectroscopy

Access to resources Recommend Favorite

Scanning Electron Microscopy (SEM)

By  

Polymers Research Journal, Vol. , Iss. , 2016-10 ,pp. : 77-76

Nova Science Publishers, Inc.

Access to resources Recommend Favorite

2.8. Scanning Electron Microscopy

By  

Journal of Characterization and Development of Novel Materials, Vol. , Iss. , 2016-01 ,pp. : 139-138

Nova Science Publishers, Inc.

Access to resources Recommend Favorite