Comprehensive Study of Lanthanum Aluminate High-Dielectric-Constant Gate Oxides for AdvancedCMOS Devices

Author： Suzuki Masamichi  

Publisher： MDPI

E-ISSN： 1996-1944|5|3|443-477

ISSN： 1996-1944

Source： Materials, Vol.5, Iss.3, 2012-03, pp. : 443-477

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