

Author: Pan Feng Chen Ruimin Xiao Yong Sun Weiming
Publisher: MDPI
E-ISSN: 1424-8220|12|1|1042-1051
ISSN: 1424-8220
Source: Sensors, Vol.12, Iss.1, 2012-01, pp. : 1042-1051
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content








Real Time Voltage and Current Phase Shift Analyzer for Power Saving Applications
By Krejcar Ondrej Frischer Robert
Sensors, Vol. 12, Iss. 8, 2012-08 ,pp. :


Non-Destructive Techniques Based on Eddy Current Testing
By García-Martín Javier Gómez-Gil Jaime Vázquez-Sánchez Ernesto
Sensors, Vol. 11, Iss. 3, 2011-02 ,pp. :