In-Situ Waviness Characterization of Metal Plates by a Lateral Shearing Interferometric Profilometer

Author： Frade María   Enguita José María   Álvarez Ignacio  

Publisher： MDPI

E-ISSN： 1424-8220|13|4|4906-4921

ISSN： 1424-8220

Source： Sensors, Vol.13, Iss.4, 2013-04, pp. : 4906-4921

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