Modeling the Microstructure Curvature of Boron-Doped Silicon in Bulk Micromachined Accelerometer

Author: Zhou Wu   Yu Huijun   Peng Bei   Shen Huaqin   He Xiaoping   Su Wei  

Publisher: MDPI

E-ISSN: 1996-1944|6|1|244-254

ISSN: 1996-1944

Source: Materials, Vol.6, Iss.1, 2013-01, pp. : 244-254

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract