Using Synchrotron Radiation-Based Infrared Microspectroscopy to Reveal Microchemical Structure Characterization: Frost Damaged Wheat vs. Normal Wheat

Author: Xin Hangshu   Zhang Xuewei   Yu Peiqiang  

Publisher: MDPI

E-ISSN: 1422-0067|14|8|16706-16718

ISSN: 1422-0067

Source: International Journal of Molecular Sciences, Vol.14, Iss.8, 2013-08, pp. : 16706-16718

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