Assessment of Global Variability in UTBB MOSFETs in Subthreshold Regime †

Author: Makovejev Sergej   Kazemi Esfeh Babak   Andrieu François   Raskin Jean-Pierre   Flandre Denis   Kilchytska Valeriya  

Publisher: MDPI

E-ISSN: 2079-9268|4|3|201-213

ISSN: 2079-9268

Source: Journal of Low Power Electronics and Applications, Vol.4, Iss.3, 2014-07, pp. : 201-213

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Abstract