Reliability Investigation of GaN HEMTs for MMICs Applications

Author: Chini Alessandro   Meneghesso Gaudenzio   Pantellini Alessio   Lanzieri Claudio   Zanoni Enrico  

Publisher: MDPI

E-ISSN: 2072-666x|5|3|570-582

ISSN: 2072-666x

Source: Micromachines, Vol.5, Iss.3, 2014-08, pp. : 570-582

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Abstract