RTS Noise and Dark Current White Defects Reduction Using Selective Averaging Based on a Multi-Aperture System

Author: Zhang Bo   Kagawa Keiichiro   Takasawa Taishi   Seo Min Woong   Yasutomi Keita   Kawahito Shoji  

Publisher: MDPI

E-ISSN: 1424-8220|14|1|1528-1543

ISSN: 1424-8220

Source: Sensors, Vol.14, Iss.1, 2014-01, pp. : 1528-1543

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Abstract