The Symmetric-Partitioning and Incremental-Relearning Classification and Back-Propagation-Network Tree Approach for Cycle Time Estimation in Wafer Fabrication

Author: Chen Toly  

Publisher: MDPI

E-ISSN: 2073-8994|6|2|409-426

ISSN: 2073-8994

Source: Symmetry, Vol.6, Iss.2, 2014-05, pp. : 409-426

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Abstract