High Accuracy Localization of Long Term Evolution Based on a New Multiple Carrier Noise Model

Author: Lee Wah Ching   Hung Faan Hei   Tsang Kim Fung   Wu Chung Kit   Chi Hao Ran   Chui Kwok Tai   Lau Wing Hong  

Publisher: MDPI

E-ISSN: 1424-8220|14|12|22613-22618

ISSN: 1424-8220

Source: Sensors, Vol.14, Iss.12, 2014-11, pp. : 22613-22618

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Abstract