Optimally Fortifying Logic Reliability through Criticality Ranking

Author: Bai Yu   Alawad Mohammed   DeMara Ronald F.   Lin Mingjie  

Publisher: MDPI

E-ISSN: 2079-9292|4|1|150-172

ISSN: 2079-9292

Source: Electronics, Vol.4, Iss.1, 2015-02, pp. : 150-172

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Abstract