Stochastically Estimating Modular Criticality in Large-Scale Logic Circuits Using Sparsity Regularization and Compressive Sensing

Author: Alawad Mohammed   DeMara Ronald F.   Lin Mingjie  

Publisher: MDPI

E-ISSN: 2079-9268|5|1|3-37

ISSN: 2079-9268

Source: Journal of Low Power Electronics and Applications, Vol.5, Iss.1, 2015-03, pp. : 3-37

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract