Non-Invasive Examination of Plant Surfaces by Opto-Electronic Means—Using Russet as a Prime Example

Author: Klemm Matthias   Röttger Olga   Damerow Lutz   Blanke Michael  

Publisher: MDPI

E-ISSN: 1424-8220|16|4|452-452

ISSN: 1424-8220

Source: Sensors, Vol.16, Iss.4, 2016-03, pp. : 452-452

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract