Defect Detection in Textures through the Use of Entropy as a Means for Automatically Selecting the Wavelet Decomposition Level

Author： Navarro Pedro J. Fernández-Isla Carlos Alcover Pedro María Suardíaz Juan

Publisher： MDPI

E-ISSN： 1424-8220|16|8|1178-1178

ISSN： 1424-8220

Source： Sensors, Vol.16, Iss.8, 2016-07, pp. : 1178-1178

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