X-ray Diffraction: A Powerful Technique for the Multiple-Length-Scale Structural Analysis of Nanomaterials

Author: Giannini Cinzia   Ladisa Massimo   Altamura Davide   Siliqi Dritan   Sibillano Teresa   De Caro Liberato  

Publisher: MDPI

E-ISSN: 2073-4352|6|8|87-87

ISSN: 2073-4352

Source: Crystals, Vol.6, Iss.8, 2016-08, pp. : 87-87

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Abstract