Design, development and applications of etched multilayers for soft X-ray spectroscopy

Author: Le Guen Karine   Benbalagh Rabah   André Jean-Michel   Coudevylle Jean-René   Jonnard Philippe  

Publisher: Edp Sciences

E-ISSN: 1286-0050|78|2|20702-20702

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.78, Iss.2, 2017-05, pp. : 20702-20702

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Abstract