Comparison of Thermal Stress during Short-Circuit in Different Types of 1.2 kV SiC Transistors Based on Experiments and Simulations

Publisher: Trans Tech Publications

E-ISSN: 1662-9752|2017|897|595-598

ISSN: 0255-5476

Source: Materials Science Forum, Vol.2017, Iss.897, 2017-06, pp. : 595-598

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Abstract