Drain Side N⁺ Layout Manners ("npnpn" Arranged-Type) on ESD Robustness in the 60-V pLDMOS-SCR

E-ISSN： 1662-7482|2017|870|401-406

ISSN： 1660-9336

Source： Applied Mechanics and Materials, Vol.2017, Iss.870, 2017-10, pp. : 401-406

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