Experimental Comparison of In-Depth Residual Stresses Measured with Neutron and X-Ray Diffraction with a Numerical Stress Relaxation Correction Method

Publisher： Trans Tech Publications

E-ISSN： 1662-9752|2017|905|131-136

ISSN： 0255-5476

Source： Materials Science Forum, Vol.2017, Iss.905, 2017-09, pp. : 131-136

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Innovative Residual Stress Measurements by X-Ray Diffraction

By  

Materials Science Forum, Vol. 2015, Iss. 812, 2015-03 ,pp. : 303-308

Trans Tech Publications

Access to resources Recommend Favorite

Comparison of Residual Stress Measured by Diffraction Method and Matrix Etching Method in SiC Fiber Reinforced Titanium Matrix Composites

By  

Materials Science Forum, Vol. 2017, Iss. 898, 2017-07 ,pp. : 865-871

Trans Tech Publications

Access to resources Recommend Favorite

Residual stresses influence on the structural evolution of Cu&unknown;Mo solid solutions studied by X-ray diffraction

By Goudeau P.   Mimault J.   Girardeau T.   Reklaoui K.   Proux O.   Branger V.  

Thin Solid Films, Vol. 275, Iss. 1, 1996-04 ,pp. : 25-28

Elsevier

Access to resources Recommend Favorite

Influence of microstructure on residual stress in tungsten thin films analyzed by X-ray diffraction

By Durand N.   Badawi K.F.   Goudeau P.  

Thin Solid Films, Vol. 275, Iss. 1, 1996-04 ,pp. : 168-171

Elsevier

Access to resources Recommend Favorite

Residual stress measurement in textured thin film by grazing-incidence X-ray diffraction

By Ma C.-H.   Huang J.-H.   Chen H.  

Thin Solid Films, Vol. 418, Iss. 2, 2002-10 ,pp. : 73-78

Elsevier

Access to resources Recommend Favorite