Potentials for Error Detection and Quality Improvement in Assembly Lines Using FFT, Clustering and Dynamic Envelope Curve

Publisher： Trans Tech Publications

E-ISSN： 1662-7482|2017|871|52-59

ISSN： 1660-9336

Source： Applied Mechanics and Materials, Vol.2017, Iss.871, 2017-11, pp. : 52-59

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