Fault Diagnosis Using Improved Complete Ensemble Empirical Mode Decomposition with Adaptive Noise and Power-Based Intrinsic Mode Function Selection Algorithm

Author： Han Hyungseob   Cho Sangjin   Kwon Sundeok   Cho Sang-Bock  

Publisher： MDPI

E-ISSN： 2079-9292|7|2|16-16

ISSN： 2079-9292

Source： Electronics, Vol.7, Iss.2, 2018-01, pp. : 16-16

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