Efficient Fault Localization and Failure Analysis Techniques for Improving IC Yield

Author: Oberai Ankush   Yuan Jiann-Shiun  

Publisher: MDPI

E-ISSN: 2079-9292|7|3|28-28

ISSN: 2079-9292

Source: Electronics, Vol.7, Iss.3, 2018-02, pp. : 28-28

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract