RTL validation methodology on high complexity wireless microcontroller using OVM technique for fast time to market

Author: Muhammad Nurul Zhafirah  

Publisher: Edp Sciences

E-ISSN: 2100-014x|162|issue|01068-01068

ISSN: 2100-014x

Source: EPJ Web of Conference, Vol.162, Iss.issue, 2017-11, pp. : 01068-01068

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