Author: Thompson Adam McNally Donal Maskery Ian Leach Richard K.
Publisher: Edp Sciences
E-ISSN: 2107-6847|8|issue|17-17
ISSN: 2107-6839
Source: International Journal of Metrology and Quality Engineering, Vol.8, Iss.issue, 2017-05, pp. : 17-17
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By Yamashita Tsuyoshi Suzuki Kazuhiro Adachi Hideki Nishino Souichiro Tomota Yo
INTER-NOISE and NOISE-CON Congress and Conference Proceedings, Vol. 2008, Iss. 9, 2008-10 ,pp. :
By Müller P. Hiller J. Cantatore A. De Chiffre L.
International Journal of Metrology and Quality Engineering, Vol. 3, Iss. 2, 2012-11 ,pp. :
X-ray computed tomography coupled to Digital Volume Correlation applied to a stationary crack case
By Barranger Y.
EPJ Web of Conference, Vol. 6, Iss. issue, 2010-06 ,pp. :