The Influence of Gate Scaling to Electrical Characteristics on n-MOS FinFET

Publisher： Edp Sciences

E-ISSN： 2261-236x|108|issue|09002-09002

ISSN： 2261-236x

Source： MATEC Web of conference, Vol.108, Iss.issue, 2017-05, pp. : 09002-09002

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