The Influence of Gate Scaling to Electrical Characteristics on n-MOS FinFET

Publisher: Edp Sciences

E-ISSN: 2261-236x|108|issue|09002-09002

ISSN: 2261-236x

Source: MATEC Web of conference, Vol.108, Iss.issue, 2017-05, pp. : 09002-09002

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract