The measuring technique developed to evaluate the thermal diffusivity of the multi-layered thin film specimens

Author: Li Tse-Chang  

Publisher: Edp Sciences

E-ISSN: 2261-236x|123|issue|00026-00026

ISSN: 2261-236x

Source: MATEC Web of conference, Vol.123, Iss.issue, 2017-09, pp. : 00026-00026

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Abstract