Prediction of electronic nanodevices technical status and reliability based on analysis of their performance parameters kinetics under the influence of external factors

Publisher： Edp Sciences

E-ISSN： 2261-236x|129|issue|03019-03019

ISSN： 2261-236x

Source： MATEC Web of conference, Vol.129, Iss.issue, 2017-11, pp. : 03019-03019

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