RadFET dose response in the CHARM mixed-field: FLUKA MC simulations

Author： Marzo Matteo Bonaldo Stefano Brugger Markus Danzeca Salvatore Garcia Alia Ruben Infantino Angelo Thornton Adam

E-ISSN： 2491-9292|3|issue|24-24

ISSN： 2491-9292

Source： EPJ Nuclear Sciences & Technologies, Vol.3, Iss.issue, 2017-07, pp. : 24-24

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Abstract

This paper focuses on Monte Carlo simulations aimed at calculating the dose response of the RadFET dosimeter, when exposed to the complex CHARM mixed-fields, at CERN. We study how the dose deposited in the gate oxide (SiO₂) of the RadFET is affected by the energy threshold variation in the Monte Carlo simulations as well as the materials and sizes of scoring volumes. Also the characteristics of the input spectra will be taken into account and their impact on the final simulated dose will be studied. Dose variation as a function of the position of the RadFET in the test facility will be then examined and comparisons with experimental results will be shown. The contribution to the total dose due to all particles of the mixed-field, under different target-shielding configurations, is finally presented, aiming at a complete characterization of the RadFETs dose response in the CHARM mixed-fields.