Frequency-domain analysis method for analyzing and improving the steady-state characteristics of microcantilever in tapping-mode atomic force microscopy

Author： Gu Xiaohui   Sun Lining   Ru Changhai  

Publisher： Edp Sciences

E-ISSN： 1286-0050|82|1|10701-10701

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.82, Iss.1, 2018-07, pp. : 10701-10701

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