Investigation of Defectivity Coming from the Back Side of Wafers during AlCu Polymer Removal Processes Performed in a Batch Spray Tool

Publisher: Trans Tech Publications

E-ISSN: 1662-9779|2018|282|220-225

ISSN: 1012-0394

Source: Solid State Phenomena, Vol.2018, Iss.282, 2018-10, pp. : 220-225

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract