Structural and ellipsometric study on tailored optical properties of tantalum oxynitride films deposited by reactive sputtering

Publisher: IOP Publishing

E-ISSN: 1361-6463|47|47|475201-475212

ISSN: 0022-3727

Source: Journal of Physics D: Applied Physics, Vol.47, Iss.47, 2014-11, pp. : 475201-475212

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Abstract