Measurement of thin film thickness during their vacuum formation

By  

Journal de Physique Appliqué, Vol. 21, Iss. S11, 1960-11 ,pp. : 222-223

Edp Sciences

Access to resources Recommend Favorite

Subwavelength ultrasonic measurement of a very thin fluid layer thickness in a trilayer

By Lenoir O.   Izbicki J.-L.   Rousseau M.   Coulouvrat F.  

Ultrasonics, Vol. 35, Iss. 7, 1997-11 ,pp. : 509-515

Elsevier

Access to resources Recommend Favorite

Measurement of thickness of a thin film by means of laser interference at many incident angles

By Ishikawa K.   Yamano H.   Kagawa K.-i.   Asada K.   Iwata K.   Ueda M.  

Optics and Lasers in Engineering, Vol. 41, Iss. 1, 2004-01 ,pp. : 19-29

Elsevier

Access to resources Recommend Favorite

Thin film thickness measurement error reduction by wavelength selection in spectrophotometry

By  

Journal of Physics: Conference Series , Vol. 584, Iss. 1, 2015-01 ,pp. : 66-71

IOP Publishing

Access to resources Recommend Favorite

Ultrasonic measurement of the thickness, phase velocity, density or attenuation of a thin-viscoelastic plate. Part II: the inverse problem

By Kinra V.K.   Iyer V.R.  

Ultrasonics, Vol. 33, Iss. 2, 1995-01 ,pp. : 111-122

Elsevier

Access to resources Recommend Favorite