IR-enhanced Si reference detectors for one-step scale transfers from 300 nm to 1000 nm

Author： Eppeldauer G P   Larason T C   Houston J M   Vest R E   Arp U   Yoon H W  

Publisher： IOP Publishing

E-ISSN： 1681-7575|51|6|S252-S257

ISSN： 0026-1394

Source： Metrologia, Vol.51, Iss.6, 2014-12, pp. : S252-S257

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Nonlinearity of the quantum efficiency of Si reflection trap detectors at 633 nm

By Stock K. D.   Morozova S.   Liedquist L.   Hofer H.  

Metrologia, Vol. 35, Iss. 4, 1998-08 ,pp. : 451-454

IOP Publishing

Access to resources Recommend Favorite

New spectral radiance scale from 220 nm to 2500 nm

By Friedrich R.   Fischer J.  

Metrologia, Vol. 37, Iss. 5, 2000-11 ,pp. : 539-542

IOP Publishing

Access to resources Recommend Favorite

Some problems in realizing an infrared spectral-irradiance scale from 1500 nm to 2400 nm at the NRC

By Gaertner A. A.   Boivin L. P.  

Metrologia, Vol. 32, Iss. 6, 1995-12 ,pp. : 615-619

IOP Publishing

Access to resources Recommend Favorite

Accurate determination of the spectral responsivity of silicon trap detectors between 238 nm and 1015 nm using a laser-based cryogenic radiometer

By Werner L.   Fischer J.   Johannsen U.   Hartmann J.  

Metrologia, Vol. 37, Iss. 4, 2000-10 ,pp. : 279-284

IOP Publishing

Access to resources Recommend Favorite

The CCPR K2.c key comparison of spectral responsivity from 200 nm to 400 nm

By Werner Lutz  

Metrologia, Vol. 51, Iss. 6, 2014-12 ,pp. : S336-S343

IOP Publishing

Access to resources Recommend Favorite