

Publisher: IOP Publishing
E-ISSN: 1361-6528|26|2|24002-24010
ISSN: 0957-4484
Source: Nanotechnology, Vol.26, Iss.2, 2015-01, pp. : 24002-24010
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content


By Ahmad M. Iqbal Z. Hong Zhanglian Yang Jingxia Zhang Yuewei Khalid N. R. Ahmed E.
Integrated Ferroelectrics, Vol. 145, Iss. 1, 2013-01 ,pp. :




By Ko Chung-Ting Yang Po-Shuan Han Yin-Yi Wang Wei-Cheng Huang Jhih-Jie Lee Yen-Hui Tsai Yi-Jen Shieh Jay Chen Miin-Jang
Nanotechnology, Vol. 26, Iss. 26, 2015-07 ,pp. :

