![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Baghaei Purya Aryadoust Vahid
Publisher: Routledge Ltd
E-ISSN: 1532-7574|15|1|71-87
ISSN: 1530-5058
Source: International Journal of Testing, Vol.15, Iss.1, 2015-01, pp. : 71-87
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Fitting Rasch Model using Appropriateness Measure Statistics
Spanish Journal of Psychology, Vol. 8, Iss. 1, 2005-05 ,pp. :