Publisher: IOP Publishing
ISSN: 1674-4926
Source: Journal of Semiconductors, Vol.35, Iss.12, 2014-12, pp. : 125001-125005
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Comparative study of leakage power in CNTFET over MOSFET device
Journal of Semiconductors, Vol. 35, Iss. 11, 2014-11 ,pp. :