Momentum microscopy of the layered semiconductor TiS2 and Ni intercalated Ni1/3TiS2

Publisher: IOP Publishing

E-ISSN: 1367-2630|17|8|146-155

ISSN: 1367-2630

Source: New Journal of Physics, Vol.17, Iss.8, 2015-08, pp. : 146-155

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract