

Publisher: John Wiley & Sons Inc
E-ISSN: 1099-0682|2015|11|1941-1945
ISSN: 1434-1948
Source: EUROPEAN JOURNAL OF INORGANIC CHEMISTRY (ELECTRONIC), Vol.2015, Iss.11, 2015-04, pp. : 1941-1945
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Abstract
AbstractAn approach is presented that enables the analysis and prediction of stacking sequences in intercalated lamellar vanadium phosphates. A comparison of previously reported vanadium phosphates reveals two modes of intercalation: (i) 3d transition metal ions intercalated between VOPO4 layers and (ii) alkali/alkaline earth metal ions between VOPO4·H2O layers. Both intercalations were investigated using DFT calculations in order to understand the relative shifts of the vanadium phosphate layers. These calculations in addition to an analysis of the stacking sequences in previously reported materials enable the prediction of the crystal structures of Mx(VOPO4)·yH2O (M = Cs+, Cd2+ and Sn2+). Experimental realization and structural determination of Cd(VOPO4)2·4H2O by single‐crystal X‐ray diffraction confirmed the predicted stacking sequences.
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