Fluorinated CYTOP passivation effects on the electrical reliability of multilayer MoS2 field-effect transistors

Publisher: IOP Publishing

E-ISSN: 1361-6528|26|45|455201-455207

ISSN: 0957-4484

Source: Nanotechnology, Vol.26, Iss.45, 2015-11, pp. : 455201-455207

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Abstract