Positive Bias Temperature Instability and Hot Carrier Injection of Back Gate Ultra-thin-body In

Author: Xiao-Yu Tang   Ji-Wu Lu   Rui Zhang   Wang-Ran Wu   Chang Liu   Yi Shi   Zi-Qian Huang   Yue-Chan Kong   Yi Zhao  

Publisher: IOP Publishing

E-ISSN: 1741-3540|32|11|117302-117305

ISSN: 0256-307X

Source: Chinese Physics Letters, Vol.32, Iss.11, 2015-11, pp. : 117302-117305

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next