Exploring experimental parameter choice for rapid speckle‐tracking phase‐contrast X‐ray imaging with a paper analyzer

Publisher： John Wiley & Sons Inc

E-ISSN： 1600-5775|22|5|1279-1288

ISSN： 0909-0495

Source： JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol.22, Iss.5, 2015-09, pp. : 1279-1288

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Single‐image phase retrieval using an edge illumination X‐ray phase‐contrast imaging setup

By  

JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol. 22, Iss. 4, 2015-07 ,pp. : 1072-1077

John Wiley & Sons Inc

Access to resources Recommend Favorite

A feasibility study of X‐ray phase‐contrast mammographic tomography at the Imaging and Medical beamline of the Australian Synchrotron

By  

JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol. 22, Iss. 6, 2015-11 ,pp. : 1509-1523

John Wiley & Sons Inc

Access to resources Recommend Favorite

Hard X‐ray phase‐contrast tomography of non‐homogeneous specimens: grating interferometry versus propagation‐based imaging

By  

JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol. 23, Iss. 5, 2016-09 ,pp. : 1202-1209

John Wiley & Sons Inc

Access to resources Recommend Favorite

X‐ray pulse wavefront metrology using speckle tracking

By  

JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol. 22, Iss. 4, 2015-07 ,pp. : 886-894

John Wiley & Sons Inc

Access to resources Recommend Favorite

Quantitative phase retrieval in X‐ray Zernike phase contrast microscopy

By  

JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol. 22, Iss. 4, 2015-07 ,pp. : 1056-1061

John Wiley & Sons Inc

Access to resources Recommend Favorite