Nanoscale multilevel switching in Ge2Sb2Te5 thin film with conductive atomic force microscopy

Author: Yang Fei   Xu Ling   Chen Jing   Xu Jun   Yu Yao   Chen Kunji   Yang Fei  

Publisher: IOP Publishing

E-ISSN: 1361-6528|27|3|35706-35712

ISSN: 0957-4484

Source: Nanotechnology, Vol.27, Iss.3, 2016-01, pp. : 35706-35712

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Abstract