Artefact reduction in fast Bayesian inversion in electrical tomography

Author： Zangl Hubert   Mühlbacher-Karrer Stephan  

Publisher： Emerald Group Publishing Ltd

ISSN： 0332-1649

Source： COMPEL: Int J for Computation and Maths. in Electrical and Electronic Eng., Vol.34, Iss.5, 2015-09, pp. : 1381-1391

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