![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Vodolazov D Yu Ilin K Merker M Siegel M
Publisher: IOP Publishing
E-ISSN: 1361-6668|29|2|25002-25008
ISSN: 0953-2048
Source: Superconductor Science and Technology, Vol.29, Iss.2, 2016-02, pp. : 25002-25008
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Rozenfel’d E. Nichipuruk A. Kogan L. Khudyakov B.
Russian Journal of Nondestructive Testing, Vol. 46, Iss. 4, 2010-04 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Kogan L. Nichipuruk A. Rozenfel’d E. Khudyakov B.
Russian Journal of Nondestructive Testing, Vol. 46, Iss. 4, 2010-04 ,pp. :