Publisher： Trans Tech Publications
E-ISSN： 1662-7482|2015|740|706-713
ISSN： 1660-9336
Source： Applied Mechanics and Materials, Vol.2015, Iss.740, 2015-04, pp. : 706-713
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Abstract
Demands of automatic recognition of abnormal patterns in control charts have been increasing nowadays in manufacturing process. Control chart pattern recognition is an important statistical process control tool used to determine whether a process is run in its intended range or not and eliminate the potential attribution factors as far as possible according to the abnormal condition shown in the control chart. This paper uses the time domain features as input vector and genetic algorithm to obtain the optimal parameters of SVM in a self-adapted manner. Design anomaly detection model for dynamic process is made to realize control chart pattern recognition under the complex condition. The experimental results show that the proposed approach method has higher detection accuracy and stronger generalization ability than other methods, so it is more suitable for quality control in production field.
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