Author： Fang Q. Piegorsch W. W. Simmons S. J. Li X. Chen C. Wang Y.
Publisher： Wiley-Blackwell
E-ISSN： 1541-0420|71|4|1168-1175
ISSN： 0006-341X
Source： Biometrics, Vol.71, Iss.4, 2015-12, pp. : 1168-1175
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