Light-induced new memory states in electronic resistive switching of NiO/NSTO junction

Author: Wei Ling   Li G Q   Zhang W F  

Publisher: IOP Publishing

E-ISSN: 1361-6463|49|4|45101-45108

ISSN: 0022-3727

Source: Journal of Physics D: Applied Physics, Vol.49, Iss.4, 2016-02, pp. : 45101-45108

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Abstract