Author: Zhang Yewen Holé Stéphane Zheng Feihu An Zhenlian Zhang Yewen
Publisher: IOP Publishing
E-ISSN: 1361-6501|27|2|25003-25010
ISSN: 0957-0233
Source: Measurement Science and Technology, Vol.27, Iss.2, 2016-02, pp. : 25003-25010
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Abstract
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